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ECE1200 データシート(PDF) 40 Page - Microchip Technology |
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ECE1200 データシート(HTML) 40 Page - Microchip Technology |
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40 / 87 page ![]() ECE1200 DS00003093C Draft-page 40 2018-2021 Microchip Technology Inc. 6.9.1 RESERVED Reserved Register locations are unused for any purpose. Writes are ignored, and Reads return “0”. 6.9.2 TEST Test Registers are reserved for Microchip use in testing. Contents of these registers are unspecified and may change dynamically. Writing these locations, even to rewrite their contents, may cause behavior that is unspecified: do not write them at all, except as directed by Microchip customer support. 6.9.3 LOGICAL DEVICE NUMBER REGISTER 6.9.4 UNCLAIMED NON-POSTED ERROR HANDLING REGISTER 28h Test 29h Test 2Ah Power Save Register 2Bh Test 2Ch Test 2Dh Reserved 2Eh Test 2Fh Test Index 07h Bits Description Type Default Reset Event 7:0 Logical Device Number R/W 00h PLTRST Index 08h Bits Description Type Default Reset Event 7:4 Reserved R 0h - 3:0 Handling selected for Unclaimed Non-Posted LPC transfers, in addition to UNSUCCESSFUL COMPLETION eSPI response: 0h = No additional action 1h = Post VWire ERROR_NONFATAL 2h = Post VWire ERROR_FATAL 3h = Post VWire SMI# 4h = Post VWire SCI# R/W 0h PLTRST TABLE 6-2: GLOBAL REGISTER SUMMARY (CONTINUED) Index Register Name |
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