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TCD1711DG データシート(PDF) 4 Page - Toshiba Semiconductor |
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TCD1711DG データシート(HTML) 4 Page - Toshiba Semiconductor |
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4 / 13 page ![]() TCD1711DG Rev.1.1 2019-03-27 3 © 2019 Toshiba Electronic Devices & Storage Corporation Optical/Electrical Characteristics Ta 25°C, VOD 10 V, V VSH VRS VCP 5 V (pulse), f 1.0 MHz, tINT (integration time) 10 ms, light source daylight fluorescent lamp Characteristics Symbol Min Typ. Max Unit Note Sensitivity R 12 15 18 V/lx s Photo response non uniformity PRNU 4 10 % (Note 2) PRNU (3) 6 12 mV (Note 8) Saturation output voltage VSAT 1.5 1.8 V (Note 3) Saturation exposure SE 0.08 0.12 lx s (Note 4) Dark signal voltage VDRK 1 3 mV (Note 5) Dark signal non uniformity DSNU 4 10 mV (Note 5) DC power dissipation PD 250 375 mW Total transfer efficiency TTE 92 98 % Output impedance ZO 0.2 1.0 k Dynamic range DR 1800 (Note 6) DC output signal voltage VOS1 3.0 4.5 6.0 V (Note 7) VOS2 3.0 4.5 6.0 DC differential error voltage │VOS1 VOS2│ 300 mV Random noise ND 1.0 mV (Note 9) Note 2: PRNU is defined on a single chip by the expressions below when the photosensitive surface is applied with the light of uniform illumination and uniform color temperature, where measured approximately 750 mV of signal output. PRNU X 100 (%) X Where X is average of total signal output and X is the maximum deviation from X under uniform illumination. (OS1) In the case of 3725 elements (OS2), the condition is the same as above too. Note 3: VSAT is defined as the minimum saturation output voltage of all effective pixels. Note 4: Definition of SE: SE VSAT R Note 5: VDRK is defined as average dark signal voltage of all effective pixels. DSNU is defined by the difference between average value (VDRK) and the maximum value of the dark voltage. Note 6: Definition of DR: DR VSAT VDRK VDRK is proportional to tINT (integration time). So shorter integration time makes wider dynamic range. OS VDRK DSNU |
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