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RHR64 データシート(PDF) 13 Page - STMicroelectronics

部品番号 RHR64
部品情報  Rad-hard, low-power, rail-to-rail CMOS operational amplifiers
PDF  20 Pages
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メーカー  STMICROELECTRONICS [STMicroelectronics]
ホームページ  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

RHR64 データシート(HTML) 13 Page - STMicroelectronics

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RHR61, RHR64
Radiations
5
Radiations
Total ionizing dose (MIL-STD-883 TM 1019)
The products guaranteed by radiation within the RHA QML-V system, fully comply with the
MIL-STD-883 TM 1019 specification.
The RHR61 and RHR64 are RHA QML-V tested and characterized in full compliance with
the MIL-STD-883 specification, condition B (between 10 and 100 mrad/s).
All parameters provided in Table 4, Table 5, and Table 6 apply to pre-irradiation, Table 7
and Table 8 apply to post-irradiation as follows:
All tests are performed in accordance with MIL-PRF-38535 and the test method 1019
of the MIL-STD-883 for total ionizing dose (TID).
The initial characterization is performed in qualification only on both biased and
unbiased parts.
Each wafer lot is tested in the worst bias case condition, based on the results obtained
during the initial qualification.
Heavy ions
The behavior of the product when submitted to heavy ions is not tested in production.
Heavy ion trials are performed on qualification lots only.
Table 9: Radiations
Type
Characteristics
Value
Unit
TID
Low-dose rate (36 to 360 rad/h) up to:
100
krad
Heavy ions
SEL immunity up to:
(with a particle angle of 60 ° at 125 °C)
120
MeV.cm²/mg
SEL immunity up to:
(with a particle angle of 0 ° at 125 °C)
60
SET immunity (at 25 °C)
Characterized
DocID027171 Rev 3
13/20



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