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MPC855T データシート(PDF) 11 Page - Freescale Semiconductor, Inc

部品番号 MPC855T
部品情報  Hardware Specifications
PDF  80 Pages
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メーカー  FREESCALE [Freescale Semiconductor, Inc]
ホームページ  http://www.freescale.com
Logo FREESCALE - Freescale Semiconductor, Inc

MPC855T データシート(HTML) 11 Page - Freescale Semiconductor, Inc

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MPC860 Family Hardware Specifications, Rev. 7
Freescale Semiconductor
11
Layout Practices
7.4 Estimation Using Simulation
When the board temperature is not known, a thermal simulation of the application is needed. The simple two-resistor
model can be used with the thermal simulation of the application [2], or a more accurate and complex model of the
package can be used in the thermal simulation.
7.5 Experimental Determination
To determine the junction temperature of the device in the application after prototypes are available, the thermal
characterization parameter (
ΨJT) can be used to determine the junction temperature with a measurement of the
temperature at the top center of the package case using the following equation:
TJ = TT + (ΨJT × PD)
where:
Ψ
JT = thermal characterization parameter
TT = thermocouple temperature on top of package
PD = power dissipation in package
The thermal characterization parameter is measured per JEDEC JESD51-2 specification using a 40 gauge type T
thermocouple epoxied to the top center of the package case. The thermocouple should be positioned so that the
thermocouple junction rests on the package. A small amount of epoxy is placed over the thermocouple junction and
over 1 mm of wire extending from the junction. The thermocouple wire is placed flat against the package case to
avoid measurement errors caused by cooling effects of the thermocouple wire.
7.6 References
Semiconductor Equipment and Materials International
(415) 964-5111
805 East Middlefield Rd.
Mountain View, CA 94043
MIL-SPEC and EIA/JESD (JEDEC) Specifications
800-854-7179 or
(Available from Global Engineering Documents)
303-397-7956
JEDEC Specifications
http://www.jedec.org
1. C.E. Triplett and B. Joiner, “An Experimental Characterization of a 272 PBGA Within an Automotive
Engine Controller Module,” Proceedings of SemiTherm, San Diego, 1998, pp. 47–54.
2. B. Joiner and V. Adams, “Measurement and Simulation of Junction to Board Thermal Resistance and Its
Application in Thermal Modeling,” Proceedings of SemiTherm, San Diego, 1999, pp. 212–220.
8
Layout Practices
Each VDD pin on the MPC860 should be provided with a low-impedance path to the board’s supply. Each GND pin
should likewise be provided with a low-impedance path to ground. The power supply pins drive distinct groups of
logic on the chip. The VDD power supply should be bypassed to ground using at least four 0.1 µF-bypass capacitors
located as close as possible to the four sides of the package. The capacitor leads and associated printed circuit traces
connecting to chip VDD and GND should be kept to less than half an inch per capacitor lead. A four-layer board
employing two inner layers as VCC and GND planes is recommended.



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