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27C256 データシート(PDF) 3 Page - Microchip Technology

部品番号 27C256
部品情報  256K (32K x 8) CMOS EPROM
PDF  10 Pages
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メーカー  MICROCHIP [Microchip Technology]
ホームページ  http://www.microchip.com
Logo MICROCHIP - Microchip Technology

27C256 データシート(HTML) 3 Page - Microchip Technology

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 2004 Microchip Technology Inc.
DS11001N-page 3
27C256
TABLE 1-3:
READ OPERATION AC CHARACTERISTICS
FIGURE 1-1:
READ WAVEFORMS
AC Testing Waveform:
VIH = 2.4V and VIL = 0.45V; VOH = 2.0V VOL = 0.8V
Output Load:
1 TTL Load + 100 pF
Input Rise and Fall Times: 10 ns
Ambient Temperature:
Commercial:
Tamb =
0°C to +70°C
Industrial:
Tamb = -40°C to +85°C
Automotive:
Tamb = -40
°C to +125°C
Parameter
Sym
27C256-90* 27C256-10* 27C256-12 27C256-15 27C256-20
Units
Conditions
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Address to Output
Delay
tACC
90
100
120
150
200
ns
CE=OE =VIL
CE to Output Delay
tCE
90
100
120
150
200
ns
OE = VIL
OE to Output Delay
tOE
40
45
—55
65
—75
ns
CE = VIL
CE or OE to O/P
High Impedance
tOFF
030
0
30
0
35
0
50
0
55
ns
Output Hold from
Address CE or OE,
whichever goes first
tOH
0
0
0
0—
0—
ns
* -10, -90 AC Testing Waveform: VIH = 2.4V and VIL = .45V; VOH = 1.5V and VOL = 1.5V
Output Load: 1 TTL Load + 30pF
Address
CE
VIH
VIL
VIH
VIL
VIH
VIL
OE
Outputs
O0 - O7
VOH
VOL
Address Valid
tCE(2)
tOE(2)
High Z
Valid Output
tACC
(1) t OFF is specified for OE or CE, whichever occurs first
(2) OE may be delayed up to t
CE
- t OE after the falling edge of CE without impact on t
CE
(3) This parameter is sampled and is not 100% tested.
High Z
tOH
tOFF(1,3)
Notes:



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