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GD25LB128DSJS データシート(PDF) 59 Page - GigaDevice Semiconductor (Beijing) Inc. |
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GD25LB128DSJS データシート(HTML) 59 Page - GigaDevice Semiconductor (Beijing) Inc. |
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59 / 75 page ![]() 1.8V Uniform Sector Dual and Quad Serial Flash GD25LB128D 59 8. ELECTRICAL CHARACTERISTICS 8.1. POWER-ON TIMING Vcc(max) Vcc(min) VWI tVSL Chip Selection is not allowed Device is fully accessible Time Table6. Power-Up Timing And Write Inhibit Threshold Symbol Parameter Min Max Unit tVSL VCC (min) To CS# Low 2.5 ms VWI Write Inhibit Voltage VCC (min) 1 1.5 V 8.2. INITIAL DELIVERY STATE The device is delivered with the memory array erased: all bits are set to 1(each byte contains FFH).The Status Register bits are set to 0, except QE bit (S9) is set to 1. 8.3. ABSOLUTE MAXIMUM RATINGS Parameter Value Unit Ambient Operating Temperature -40 to 85 -40 to 105 -40 to 125 ℃ Storage Temperature -65 to 150 ℃ Applied Input/Output Voltage -0.6 to VCC+0.4 V Transient Input/Output Voltage (note: overshoot) -2.0 to VCC+2.0 V VCC -0.6 to 2.5 V |
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