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PCF7936AS データシート(PDF) 27 Page - NXP Semiconductors

部品番号 PCF7936AS
部品情報  Security Transponder (HITAG2)
PDF  32 Pages
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メーカー  PHILIPS [NXP Semiconductors]
ホームページ  http://www.nxp.com
Logo PHILIPS - NXP Semiconductors

PCF7936AS データシート(HTML) 27 Page - NXP Semiconductors

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NXP Semiconductors
Product Specification
Security Transponder (HITAG2)
PCF7936AS
2010 May 04
27
CONFIDENTIAL
10 DEVICE CHARACTERISTICS
10.1 Electrical Characteristics
Tamb = -40 to +85°C, fSYS = 125kHz, TO = 1/fSYS. Unless otherwise specified
SYMBOL
PARAMETER
CONDITION
MIN
TYP
MAX
UNIT
Operating Conditions
fRES
Resonance frequency
121
129
kHz
BW
Bandwidth
2.3
kHz
BTHR
Magnetic flux density,
Read direction
35
400
μT
PP
BPRG
Magnetic flux density, Note 1
For EEPROM programming
m = 0,95, TWRP = 8 TO
35
400
μT
PP
BAUT
Magnetic flux density, Note 1
For device authentication
m = 0,95, TWRP = 8 TO
35
400
μT
PP
BREAD
LF field absorption in read direction, Note 1
BFIELD = 35 μTPP
8
μT
PP
MIPRG
Minimum modulation index (m), Note 1
Write direction, device programming and
authentication
BFIELD = 35 μTPP, TWRP = 8 TO
95
%
EEPROM
TRET
Data retention time
Tamb = 50°C
20
years
NWR-CYL
Write endurance, page 1 to 7
100 k
cycle
Note
1. Modulation index (m) and LF Field absorption (BREAD) are defined according to Figure 25.
2. Parameters are measured with the Scemtech test equipment STM-1 in a Helmholtz arrangement according to section 11.
Transponder
LF Field
BMIN
BMAX - BMIN
m =
BMAX + BMIN
BMAX
BREAD = BMAX - BMIN
Figure 25. Definition of modulation index (m) and LF field absorption (BREAD)



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