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FXLS8964AF データシート(PDF) 8 Page - NXP Semiconductors |
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FXLS8964AF データシート(HTML) 8 Page - NXP Semiconductors |
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8 / 98 page  NXP Semiconductors FXLS8964AF 3-Axis Low-g Accelerometer VDD = 1.8 V to 3.0 V, T = –40 °C to 105 °C, unless otherwise noted. Typical values represent mean or mean ±1 σ values, depending on the specific parameter. Symbol Parameter Conditions Min Typ Max Unit ±2 g mode 0.87 0.98 1.12 ±4 g mode 1.74 1.95 2.23 ±8 g mode 3.47 3.91 4.46 ±16 g mode 6.94 7.81 8.93 mg/LSB ±2 g mode 896 1024 1152 ±4 g mode 448 512 576 ±8 g mode 224 256 288 SEN Nominal sensitivity ±16 g mode 112 128 144 LSB/g SENTOL Sensitivity tolerance[1] — — ±2.5 — %SEN TCS Temperature coefficient of sensitivity[1] –40 °C to +105 °C — ±0.01 — %/°C OFFPBM Zero-g offset, post-board mount [1][2] — –550 ±250 550 mg TCOPBM Zero-g offset temperature coefficient, post-board mount[1] –40 °C to +105 °C — ±1 — mg/°C CAS Cross-axis sensitivity[3] ±2/4 g mode — ±0.5 — % ±4 g mode, X axis –206 –139 –81 ±4 g mode, Y axis 78 137 207 ±4 g mode, Z axis –727 –448 –120 ±8 g mode, X axis –103 –69 –40 ±8 g mode, Y axis 38 68 103 ±8 g mode, Z axis –355 –223 –71 ±16 g mode, X axis –52 –35 –19 ±16 g mode, Y axis 19 34 52 STOC Self-test output change[4] ±16 g mode, Z axis –178 -112 –35 LSB ±4 g mode –1600 — +1600 ±8 g mode –800 — +800 STOF Self-test offset[4] ±16 g mode –400 — +400 LSB BWMAX Maximum signal bandwidth ODR = 3200 Hz — 1600 — Hz ODRMAX Maximum ODR — — 3200 — Hz NSDHPM Noise spectral density, high performance mode ±2 g mode — 280 — µg/√Hz NSDLPM-1 Noise spectral density, low-power mode, high-ODR range[5] 200 Hz ≤ ODR ≤ 3200 Hz, ±2 g mode — 1120 to 280 — µg/√Hz NSDLPM-2 Noise spectral density, low-power mode, low-ODR range[5] 0.781 Hz ≤ ODR < 200 Hz, ±2 g mode — 16.8 to 1.1 — mg/√Hz Table 7. Accelerometer sensor performance parameters...continued FXLS8964AF All information provided in this document is subject to legal disclaimers. © NXP B.V. 2021. All rights reserved. Product data sheet Rev. 3.4 — 7 December 2021 8 / 98 |
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