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AT28HC256N データシート(PDF) 6 Page - ATMEL Corporation |
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AT28HC256N データシート(HTML) 6 Page - ATMEL Corporation |
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6 / 13 page ![]() 6 AT28HC256N 3446B–PEEPR–4/04 AC Read Waveforms(1)(2)(3)(4) Notes: 1. CE may be delayed up to t ACC - tCE after the address transition without impact on tACC. 2. OE may be delayed up to t CE - tOE after the falling edge of CE without impact on tCE or by tACC - tOE after an address change without impact on tACC. 3. t DF is specified from OE or CE whichever occurs first (CL = 5 pF). 4. This parameter is characterized and is not 100% tested. Note: 1. This parameter is characterized and is not 100% tested. AC Read Characteristics Symbol Parameter AT28C256N-90 AT28HC256N-12 Units Min Max Min Max t ACC Address to Output Delay 90 120 ns tCE (1) CE to Output Delay 90 120 ns t OE (2) OE to Output Delay 0 40 0 50 ns t DF (3)(4) CE or OE to Output Float 0 40 0 50 ns t OH Output Hold from OE, CE or Address, whichever occurred first 00 ns tCE tOE tACC tDF tOH Input Test Waveforms and Measurement Level Output Test Load t R, tF < 5 ns Pin Capacitance f = 1 MHz, T = 25°C (1) Symbol Typ Max Units Conditions CIN 46 pF VIN = 0V C OUT 812 pF V OUT = 0V |
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