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AM29PDL128G35PEFN データシート(PDF) 69 Page - Advanced Micro Devices

部品番号 AM29PDL128G35PEFN
部品情報  128 Megabit (8 M x 16-Bit/4 M x 32-Bit) CMOS 3.0 Volt-only, Simultaneous Read/ Write Flash Memory with VersatileIOTM Control
PDF  71 Pages
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メーカー  AMD [Advanced Micro Devices]
ホームページ  http://www.amd.com
Logo AMD - Advanced Micro Devices

AM29PDL128G35PEFN データシート(HTML) 69 Page - Advanced Micro Devices

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Am29PDL128G
October 28, 2004
P R E L IM IN A R Y
REVISION SUMMARY
Revision A (October 29, 2001)
Initial release.
Revision A+1 (November 13, 2001)
Simultaneous Operation Block Diagram
Added drawing.
Table 13. “Primary Vendor-Specific Extended
Query”
Corrected data for 4Dh and 4Eh addresses (dou-
ble-word mode).
Physical Dimensions
Added LAB080 package drawing.
Revision A+2 (February 8, 2002)
Global
Added 90 ns speed option. At this speed, t
DF is 30 ns
and t
OH is 5 ns. For all speeds, changed typical word
programming time to 8.6 µs, and typical double word
programming time to 12.6 µs.”
Simultaneous Operation Block Diagram
Deleted BYTE# input.
Revision B (April 26, 2002)
Global
Added 70R (regulated voltage range) to speed op-
tions.
Ordering Information
Added “V” to package marking.
Device Bus Operations
Corrected sector size references in sector address ta-
ble.
Password Protection Mode section: Clarified that first
8 bytes of SecSi Sector should be reserved for the
password. Added description of using password and
SecSi Sector concurrently.
SecSi Sector Flash Memory Region
Added section on using password and SecSi Sector
concurrently.
Table 13. “Primary Vendor-Specific Extended
Query”
Corrected data for addresses 4D and 4Eh.
Command Definitions
Deleted PPB Status Command section.
Password Program Command section: Modified first
paragraph.
Password Unlock Command section: Modified second
paragraph.
PPB Lock Bit Set Command section: Modified entire
section.
Substantial modifications were made to the command
definitions tables and notes, including the following:
deleted the PPB Status command sequence; added
bank address requirements to SecSi Sector com-
mand; separated memory array and sector protection
command sequences for easier reference.
DC Characteristics
In Note 1 of the CMOS Compatible table, changed typ-
ical I
CC current from 2 to 4mA/MHz. Changed ICC1 typi-
cal and maximum read currents, added currents for 10
MHz operation. Added specifications for intra-page
read current. Changed I
CC6 typical current to 30 mA.
Revision B+1 (June 7, 2002)
Global
Changed data sheet status from Advance Information
to Preliminary.
AC Characteristics: Read-only Operations table
Changed t
OE fo r 9 0 ns s p eed f r om 4 0 t o 35 ns.
Changed t
OH for 70 ns speeds from 4 to 5 ns.
AC Characteristics: Erase and Program Operations
table, Alternate CE# Controlled Erase and Program
Operations table
Changed t
ASO for 70 ns sp eed fr om 15 to 12 ns.
Changed t
DS fo r 80 ns s peed f r om 45 t o 35 ns.
Changed t
OEPH from 20 to 10 ns. Changed all typical
values from t
WHWH1.
Erase and Programming Performance
Added or modified typical and maximum values to all
parameters in table except for typical sector erase
time.
Revision B+2 (July 29, 2002)
Global
Changed Simultaneous Operation Flash to Simulta-
neous Read/ Write Flash.
Changed all references to DPB to DYB.
BGA Package Capacitance
Replaced TSOP Pin Capacitance with FBGA Capaci-
tance data.
Table 7. Autoselect Codes (High Voltage Method)
Changed the A5 to A4 and A3 Sector Protection Verifi-
cation fields from L to H.



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