STM32L100RB datasheet(87/103 Pages) STMICROELECTRONICS

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STM32L100C6 STM32L100R8/RB

Electrical characteristics

dGain/dT(1)

Gain error temperature

coefficient

VDDA = 3.3V, TA = 0 to 50 ° C

DAC output buffer OFF

-10

-2

µV/°C

VDDA = 3.3V, TA = 0 to 50 ° C

DAC output buffer ON

-40

-8

TUE(1)

Total unadjusted error

CL ≤ 50 pF, RL ≥ 5 kΩ

DAC output buffer ON

-12

LSB

No RL, CL ≤ 50 pF

DAC output buffer OFF

-8

tSETTLING

Settling time (full scale: for a

12-bit code transition

between the lowest and the

highest input codes till

DAC_OUT reaches final

value ±1LSB

CL ≤ 50 pF, RL ≥ 5 kΩ

-7

µs

Update rate

Max frequency for a correct

DAC_OUT change (95% of

final value) with 1 LSB

variation in the input code

CL ≤ 50 pF, RL ≥ 5 kΩ

Msps

tWAKEUP

Wakeup time from off state

(setting the ENx bit in the

DAC Control register)(7)

CL ≤ 50 pF, RL ≥ 5 kΩ

-9

µs

PSRR+

VDDA supply rejection ratio

(static DC measurement)

CL ≤ 50 pF, RL ≥ 5 kΩ

-60

-35

1. Guaranteed by characterization results.

2. Difference between two consecutive codes - 1 LSB.

3. Difference between measured value at Code i and the value at Code i on a line drawn between Code 0 and last Code

4095.

4. Difference between the value measured at Code (0x800) and the ideal value = VDDA/2.

5. Difference between the value measured at Code (0x001) and the ideal value.

6. Difference between ideal slope of the transfer function and measured slope computed from code 0x000 and 0xFFF when

buffer is OFF, and from code giving 0.2 V and (VDDA – 0.2) V when buffer is ON.

7. In buffered mode, the output can overshoot above the final value for low input code (starting from min value).

Table 56. DAC characteristics (continued)

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

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