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MPC7410EC データシート(PDF) 22 Page - NXP Semiconductors

部品番号 MPC7410EC
部品情報  MPC7410 RISC Microprocessor Hardware Specifications
PDF  56 Pages
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メーカー  NXP [NXP Semiconductors]
ホームページ  http://www.nxp.com
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MPC7410 RISC Microprocessor Hardware Specifications, Rev. 6.1
22
Freescale Semiconductor
Electrical and Thermal Characteristics
Figure 11 provides the AC test load for TDO and the boundary-scan outputs of the MPC7410.
Figure 11. Alternate AC Test Load for the JTAG Interface
Figure 12 provides the JTAG clock input timing diagram.
Figure 12. JTAG Clock Input Timing Diagram
TRST assert time
tTRST
25
ns
2
Input setup times:
Boundary-scan data
TMS, TDI
tDVJH
tIVJH
4
0
ns
3
Input hold times:
Boundary-scan data
TMS, TDI
tDXJH
tIXJH
20
25
ns
3
Valid times:
Boundary-scan data
TDO
tJLDV
tJLOV
4
4
20
25
ns
4
TCK to output high impedance:
Boundary-scan data
TDO
tJLDZ
tJLOZ
3
3
19
9
ns
4, 5
5
Notes:
1. All outputs are measured from the midpoint voltage of the falling/rising edge of TCLK to the midpoint of the signal
in question. The output timings are measured at the pins. All output timings assume a purely resistive 50-
Ω load
(see Figure 11). Time-of-flight delays must be added for trace lengths, vias, and connectors in the system.
2. TRST is an asynchronous level sensitive signal. The setup time is for test purposes only.
3. Non-JTAG signal input timing with respect to TCK.
4. Non-JTAG signal output timing with respect to TCK.
5. Guaranteed by design and characterization.
Table 11. JTAG AC Timing Specifications (Independent of SYSCLK) 1 (continued)
At recommended operating conditions (see Table 3)
Parameter
Symbol
Min
Max
Unit
Notes
Output
Z0 = 50 Ω
OVDD/2
RL = 50 Ω
TCLK
VM
VM
VM
VM = Midpoint Voltage (OVDD/2)
tTCLK
tJR
tJF
tJHJL



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