SRTAG2KL datasheet(47/51 Pages) STMICROELECTRONICS

47 / 51 page

DocID026583 Rev 2

47/51

SRTAG2KL

Maximum rating

Stressing the device above the rating listed in Table 55 may cause permanent damage to

the device. These are stress ratings only and operation of the device at these or any other

conditions above those indicated in the operating sections of this specification is not implied.

Exposure to absolute maximum rating conditions for extended periods may affect the device

reliability.

Table 55. Absolute maximum ratings

Symbol

Parameter

Min.

Max.

Unit

Ambient operating temperature

-40

°C

TSTG, hSTG,

tSTG

Storage conditions

Sawn wafer on

UV tape

°C

6 (1)

1. Counted from ST shipment date.

months

kept in its original packing form

TSTG

Storage temperature

Sawn Bumped

Wafer

(kept in its

antistatic bag)

°C

Storage time

months

ICC (2)

2. Based on characterization, not tested in production. Maximum absorbed power = 100 mW @ 7.5 A/m

RF supply current AC0 - AC1

100

VMAX_1 (2)

RF input voltage

amplitude between

AC0 and AC1, VSS

pad left floating

VAC0-VAC1

(Peak to Peak)

-10

VESD

Electrostatic discharge

voltage (human body

model) (3)

3. AEC-Q100-002 (compliant with JEDEC Std JESD22-A114A, C1 = 100 pF, R1 = 1500

Ω, R2 = 500 Ω)

AC0-AC1

1000

SRTAG2KL データシート(PDF) 47 Page - STMicroelectronics

SRTAG2KL データシート(HTML) 47 Page - STMicroelectronics

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51

データシートダウンロード