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HT7L4811 データシート(PDF) 3 Page - Holtek Semiconductor Inc |
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HT7L4811 データシート(HTML) 3 Page - Holtek Semiconductor Inc |
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3 / 12 page ![]() Rev. 1.30 3 June 26, 2015 HT7L4811 Electrical Characteristics VCC=18V, Ta=25°C Symbol Parameter Test Condition Min Typ Max Unit Power Supply (VCC Pin) VCCON UVLOON — — 18 — V VCCOFF UVLOOFF — — 10 — V VCCHYS UVLO Hysteresis — 7 — — V VOVP VCC OVP Trip Point — 26 29 32 V ISTART Start-up Current Before turn-on, @ VCC = UVLOON - 1V — 10 20 μA IQ Quiescent Current No switching — 0.6 1 mA ICC Operating Current @ 70kHz, Co=1nF — 1.8 2.5 mA Error Amplifier VFB Feedback Reference Voltage Ta = 25°C 194 200 206 mV Current Sense Comparator tLEB Leading Edge Blanking Time — — 400 — ns VCL Current Limit Threshold — — 1.3 — V VOCP Over Current Trip Point — — 0.9 — V Over Current Release Point — — 0.2 — V Zero Current Detector VZCDH Upper Clamp Voltage IZCD = 300μA — 3 — V VZCDL Lower Clamp Voltage IZCD = -2.5mA — -0.2 — V VZCDA Positive-Going Edge — — 1.5 — V VZCDT Negative-Going Edge — — 1 — V IOVP OVP Current on ZCD pin — 270 300 330 μA tB_OVP Blanking Time for OVP Detection — — 1 — μs Starter tSTART Start Timer Period — — 40 — μs tOFF Minimum Off Time — — 4 — μs Over Temperature Protection OTP Over Temperature Trip Point — — 150 — °C Absolute Maximum Ratings VCCsupplyvoltage................................ -0.3Vto33V InputvoltagetoCSpin............................. -0.3Vto6V OutputvoltageatCOMPpin.................... -0.3Vto6V MaximumcurrentatZCDpin................3mA(source), 3mA(sink) Maximumoperatingjunctiontemperature......... 150°C Storagetemperaturerange.................. -55°Cto150°C Recommended Operating Ranges VCCsupplyvoltage...................................17Vto25V Operatingjunctiontemperature..........−40°Cto125°C Note:Thesearestressratingsonly.Stressesexceedingtherangespecifiedunder″AbsoluteMaximumRatings″ maycausesubstantialdamagetothedevice.Functionaloperationofthisdeviceatotherconditionsbeyond thoselistedinthespecificationisnotimpliedandprolongedexposuretoextremeconditionsmayaffect devicereliability. |
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