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AD9268-80EBZ データシート(PDF) 13 Page - Analog Devices |
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AD9268-80EBZ データシート(HTML) 13 Page - Analog Devices |
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13 / 45 page ![]() AD9268 Rev. A | Page 12 of 44 ABSOLUTE MAXIMUM RATINGS THERMAL CHARACTERISTICS Table 6. Parameter Rating ELECTRICAL1 AVDD to AGND −0.3 V to +2.0 V DRVDD to AGND −0.3 V to +2.0 V VIN+A/VIN+B, VIN−A/VIN−B to AGND −0.3 V to AVDD + 0.2 V CLK+, CLK− to AGND −0.3 V to AVDD + 0.2 V SYNC to AGND −0.3 V to AVDD + 0.2 V VREF to AGND −0.3 V to AVDD + 0.2 V SENSE to AGND −0.3 V to AVDD + 0.2 V VCM to AGND −0.3 V to AVDD + 0.2 V RBIAS to AGND −0.3 V to AVDD + 0.2 V CSB to AGND −0.3 V to DRVDD + 0.2 V SCLK/DFS to AGND −0.3 V to DRVDD + 0.2 V SDIO/DCS to AGND −0.3 V to DRVDD + 0.2 V OEB −0.3 V to DRVDD + 0.2 V PDWN −0.3 V to DRVDD + 0.2 V D0A/D0B through D15A/D15B to AGND −0.3 V to DRVDD + 0.2 V DCOA/DCOB to AGND −0.3 V to DRVDD + 0.2 V ENVIRONMENTAL Operating Temperature Range (Ambient) −40°C to +85°C Maximum Junction Temperature Under Bias 150°C Storage Temperature Range (Ambient) −65°C to +150°C The exposed paddle must be soldered to the ground plane for the LFCSP package. Soldering the exposed paddle to the PCB increases the reliability of the solder joints and maximizes the thermal capability of the package. Typical θJA is specified for a 4-layer PCB with a solid ground plane. As shown in Table 7, airflow improves heat dissipation, which reduces θJA. In addition, metal in direct contact with the package leads from metal traces, through holes, ground, and power planes, reduces θJA. Table 7. Thermal Resistance Package Type Airflow Velocity (m/sec) θJA1,2 θJC1,3 θJB1,4 Unit 64-Lead LFCSP (CP-64-6) 0 18.5 1.0 °C/W 1.0 16.1 9.2 °C/W 2.5 14.5 °C/W 1 Per JEDEC 51-7, plus JEDEC 25-5 2S2P test board. 2 Per JEDEC JESD51-2 (still air) or JEDEC JESD51-6 (moving air). 3 Per MIL-Std 883, Method 1012.1. 4 Per JEDEC JESD51-8 (still air). ESD CAUTION 1 The inputs and outputs are rated to the supply voltage (AVDD or ARVDD) + 0.2 V but should not exceed 2.1 V. Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. |
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