AS1181 datasheet(72/92 Pages) AMSOSRAM

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AS1181

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DS001139 • v3-00 • 2026-Apr-01

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8.3.30

IRQ_ENABLE2 register (Address 0x1A3C)

Table 42: IRQ_ENABLE2 register (Write Access when config_mode ==1)

Addr: 0x1A3C

IRQ_ENABLE2

Bit

Bit field

Default

Access

Bit description

6:0

irq_enable[38:32]

OTP

Bit n: Interrupt is enabled when bit is set, otherwise

disabled

vled_monitor_error

VLED monitor BIST fail

vp18_monitor_error

VP18 monitor BIST fail

temp_detect_error

Temperature detector BIST fail

adc_bist_error

ADC BIST fail

ls_overcurrent

Driver gate low -> low side

overcurrent

driver_gate_short

Driver gate short

ldo_overcurrent

LDO overcurrent

8.3.31

TST_INTERVAL register (Address 0x1A40)

Table 43: TST_INTERVAL register (Read and Write Access when config_mode==1)

Addr: 0x1A40

TST_INTERVAL

Bit

Bit field

Default

Access

Bit description

11:0

pertest_interval[11:0]

OTP

periodic test time repetition rate, range: 0.25s to 4s

0x000 = no periodic test / periodic test disabled

0x001 = do not use

…….

0x0FA = 0.25s

0x3FF = 1sec

0xFFF = 4sec

Note: If value is 0 during Boot, a changed value will be

applied after first illumination. If value is different than

"0" a changed value will be applied after timer elapsed.

Do not use configurations <0.25s

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