E2000 datasheet(17/104 Pages) INTEL

17 / 104 page

Datasheet

Electrical Specifications

The TESTHI signals may use individual pull-up resistors or be grouped together as

detailed below. A matched resistor must be used for each group:

• TESTHI[1:0]

• TESTHI[7:2]

• TESTHI8/FC42 – cannot be grouped with other TESTHI signals

• TESTHI9/FC43 – cannot be grouped with other TESTHI signals

• TESTHI10 – cannot be grouped with other TESTHI signals

• TESTHI11 – cannot be grouped with other TESTHI signals

• TESTHI12/FC44 – cannot be grouped with other TESTHI signals

• TESTHI13 – cannot be grouped with other TESTHI signals

However, use of boundary scan test will not be functional if these lands are connected

together. For optimum noise margin, all pull-up resistor values used for TESTHI[13:0]

lands should have a resistance value within ± 20% of the impedance of the board

transmission line traces. For example, if the nominal trace impedance is 50 Ω, then a

value between 40 Ω and 60 Ω should be used.

2.6

Voltage and Current Specification

2.6.1

Absolute Maximum and Minimum Ratings

Table 4 specifies absolute maximum and minimum ratings only and lie outside the

functional limits of the processor. Within functional operation limits, functionality and

long-term reliability can be expected.

At conditions outside functional operation condition limits, but within absolute

maximum and minimum ratings, neither functionality nor long-term reliability can be

expected. If a device is returned to conditions within functional operation limits after

having been subjected to conditions outside these limits, but within the absolute

maximum and minimum ratings, the device may be functional, but with its lifetime

degraded depending on exposure to conditions exceeding the functional operation

condition limits.

At conditions exceeding absolute maximum and minimum ratings, neither functionality

nor long-term reliability can be expected. Moreover, if a device is subjected to these

conditions for any length of time then, when returned to conditions within the

functional operating condition limits, it will either not function, or its reliability will be

severely degraded.

Although the processor contains protective circuitry to resist damage from static

electric discharge, precautions should always be taken to avoid high static voltages or

electric fields.

E2000 データシート(PDF) 17 Page - Intel Corporation

E2000 データシート(HTML) 17 Page - Intel Corporation

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 100 ...More

データシートダウンロード