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AD9444-CMOS/PCB データシート(PDF) 8 Page - Analog Devices |
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AD9444-CMOS/PCB データシート(HTML) 8 Page - Analog Devices |
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8 / 41 page ![]() AD9444 Rev. 0 | Page 7 of 40 N+1 N+2 N–1 tCLKL 12 CYCLES N tCLKH tPD VIN CLK+ CLK– DX DCO+ DCO– tDCOPD N-12 N-11 N-1 N Figure 3. CMOS Timing Diagram EXPLANATION OF TEST LEVELS Test Level Definitions I 100% production tested. II 100% production tested at 25°C and sample tested at specified temperatures. III Sample tested only. IV Parameter is guaranteed by design and characterization testing. V Parameter is a typical value only. VI 100% production tested at 25°C and guaranteed by design and characterization for industrial temperature range. |
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