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FDMF5821 データシート(PDF) 18 Page - ON Semiconductor

部品番号 FDMF5821
部品情報  Smart Power Stage (SPS) Module with Integrated Temperature Monitor
PDF  26 Pages
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メーカー  ONSEMI [ON Semiconductor]
ホームページ  http://www.onsemi.com
Logo ONSEMI - ON Semiconductor

FDMF5821 データシート(HTML) 18 Page - ON Semiconductor

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FDMF5821 • Rev. 1.0
17
Programmable Thermal Shutdown (P-THDN)
When the TMON pin voltage exceeds 1.5 V, the internal
comparator shuts down the driver (EN pin goes LOW).
The programmable thermal shutdown temperature
range can be adjusted by RTMON so that the shutdown
temperature can be customized. The equation below
shows the relationship between RTMON value in design
and desirable thermal shutdown temperature.
(2)
Figure 36 shows the relationship between RTMON and P-
THDN temperature. Increasing the RTMON value results
in a lower P-THDN temperature. The system designer
can define the shutdown temperature of FDMF5821
based on the system thermal design.
The P-THDN is a latch-off shutdown, so the (POR) on
VCC is needs to re-enable the gate driver. If not using
TMON / P-THDN features, tie the TMON pin to AGND.
100
200
P-THDN
Temp. [°C]
29.5 RTMON [kW]
* VTMON = 1.5 V, CTMON = 0.1 µF
25.9
23
150
Figure 36.
RTMON vs. P-THDN Temperature
Catastrophic Fault
SPS FDMF5821 includes a catastrophic fault feature. If
a HS MOSFET short is detected, the driver internally
pulls the EN / FAULT# pin LOW and shuts down the
SPS driver. The intention is to implement a basic circuit
to test the HS MOSFET short by monitoring LDRV and
the state of SW node.
If a HS short fault is detected, the SPS module clocks
the fault latch shutting down the module. The module
requires a VCC POR event to restart.
PWM
LDRV
(internal)
SW
SW-Fault
(internal)
FAULT
(internal)
EN/FAULT#
Potential noise from
adjacent phases switching
HS FET short during
LS FET turning on
false trigger
Normal switching operation
EN/FAULT#
pulled LOW and
driver IC disabled
Figure 37.
Catastrophic Fault Waveform



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