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AM652X データシート(PDF) 234 Page - Texas Instruments

部品番号 AM652X
部品情報  Sitara Processors
PDF  299 Pages
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メーカー  TI1 [Texas Instruments]
ホームページ  http://www.ti.com
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AM652X データシート(HTML) 234 Page - Texas Instruments

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TRC_DATA
TRC_CLK
(
)
(
)
Worst Case 1
(Ideal)
Worst Case 2
DBTR1
DBTR2
DBTR3
DBTR4
DBTR6
DBTR5
DBTR7
DBTR4
DBTR6
DBTR9
DBTR5
DBTR7
DBTR8
DBTR8
DBTR9
SPRSP08_Debug_01
234
AM6548, AM6528, AM6546
AM6526, AM6527
SPRSP08E – NOVEMBER 2017 – REVISED OCTOBER 2018
www.ti.com
Submit Documentation Feedback
Product Folder Links: AM6548 AM6528 AM6546 AM6526 AM6527
Specifications
Copyright © 2017–2018, Texas Instruments Incorporated
For more information, see section Universal Serial Bus (USB) Subsystem in chapter Peripherals of the
device TRM.
5.11.6 Emulation and Debug
5.11.6.1 Debug Trace
Table 5-124 and Figure 5-131 assume testing over the recommended operating conditions and electrical
characteristic conditions.
Table 5-124. Debug Trace Switching Characteristics
NO.
PARAMETER
DESCRIPTION
MIN
MAX
UNIT
DBTR1
tc(TRC_CLK)
Cycle time, TRC_CLK
10.16
ns
DBTR2
tw(TRC_CLKH)
Pulse width, TRC_CLK high
4.33
ns
DBTR3
tw(TRC_CLKL)
Pulse width, TRC_CLK low
4.33
ns
DBTR4
tosu(TRC_DATAV-
TRC_CLK)
Output setup time, TRC_DATA valid to TRC_CLK edge
1.27
ns
DBTR5
toh(TRC_CLK-TRC_DATAI)
Output hold time, TRC_CLK edge to TRC_DATA invalid
1.27
ns
DBTR6
tosu(TRC_CTLV-TRC_CLK)
Output setup time, TRC_CTL valid to TRC_CLK edge
1.27
ns
DBTR7
toh(TRC_CLK-TRC_CTLI)
Output hold time, TRC_CLK edge to TRC_CTL invalid
1.27
ns
DBTR8
trx(TRC_CLK_DATA_CTL)
Output rise time, 30% VDD to 70% VDD
0.75
ns
DBTR9
tfx(TRC_CLK_DATA_CTL)
Output fall time, 70% VDD to 30% VDD
0.75
ns
Figure 5-131. Debug Trace Timing
5.11.6.2 IEEE 1149.1 Standard-Test-Access Port (JTAG)
For more details about features and additional description information on the device IEEE 1149.1
Standard-Test-Access Port, see the corresponding sections within Section 4.3, Signal Descriptions and
Section 6, Detailed Description.
5.11.6.2.1 JTAG Electrical Data and Timing
Table 5-125, Table 5-126, and Figure 5-132 assume testing over the recommended operating conditions
and electrical characteristic conditions.
Table 5-125. Timing Requirements for IEEE 1149.1 JTAG
NO.
PARAMETER
DESCRIPTION
MIN
MAX
UNIT
J1
tc(TCK)
Cycle time minimum, TCK
75
ns
J2
tw(TCKH)
Pulse width minimum, TCK high
30
ns
J3
tw(TCKL)
Pulse width minimum, TCK low
30
ns



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