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NCV8461 データシート(PDF) 9 Page - ON Semiconductor |
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NCV8461 データシート(HTML) 9 Page - ON Semiconductor |
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9 / 10 page ![]() NCV8461 www.onsemi.com 9 TYPICAL PERFORMANCE CHARACTERISTICS Figure 16. Junction to Ambient Transient Thermal Impedance (600 mm2 Copper Area) 0.001 0.01 0.1 1 10 100 0.000001 0.00001 0.0001 0.001 0.01 0.1 1 10 100 1000 PULSE TIME (sec) Single Pulse 1% 20% 2% 5% 50% Duty Cycle 10% PsiLA(t) ISO 7637-2:2011 (E) PULSE TEST RESULTS ISO 7637−2:2011(E) Test Pulse Test Severity Levels, 13.5 V System Delays and Impedance # of Pulses or Test Time Pulse / Burst Rep. Time III IV 1 −112 −150 2 ms, 10 W 500 pulses 0.5 s 2a +55 +112 0.05 ms, 2 W 500 pulses 0.5 s 3a −165 −220 0.1 ms, 50 W 1 h 100 ms 3b +112 +150 0.1 ms, 50 W 1 h 100 ms ISO 7637−2:2011(E) Test Pulse Test Results III IV 1 C C 2a C E 3a C C 3b C C Class Functional Status C One or more functions of a device do not perform as designed during exposure but return automatically to normal operation after exposure is removed. E One or more functions of a device do not perform as designed during and after exposure and cannot be returned to proper operation without replacing the device. |
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