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ADXL346ACCZ-R2 データシート(PDF) 19 Page - Analog Devices

部品番号 ADXL346ACCZ-R2
部品情報  3-Axis, ±2 g/±4 g/±8 g/±16 g Ultralow Power Digital Accelerometer
PDF  40 Pages
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ホームページ  http://www.analog.com
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Data Sheet
ADXL346
INTERRUPTS
The ADXL346 provides two output pins for driving interrupts:
INT1 and INT2. Both interrupt pins are push-pull, low impedance
pins with the output specifications listed in Table 13. The default
configuration of the interrupt pins is active high. This can be
changed to active low by setting the INT_INVERT bit (Bit D5)
in the DATA_FORMAT (Address 0x31) register. All functions
can be used simultaneously, with the only limiting feature being
that some functions may need to share interrupt pins.
Interrupts are enabled by setting the appropriate bit in the
INT_ENABLE register (Address 0x2E) and are mapped to either
the INT1 or INT2 pin based on the contents of the INT_MAP
register (Address 0x2F). When initially configuring the interrupt
pins, it is recommended that the functions and interrupt mapping
be done before enabling the interrupts. When changing the con-
figuration of an interrupt, it is recommended that the interrupt be
disabled first, by clearing the bit corresponding to that function in
the INT_ENABLE register, and then the function be reconfigured
before enabling the interrupt again. Configuration of the functions
while the interrupts are disabled helps to prevent the accidental
generation of an interrupt before it is desired.
The interrupt functions are latched and cleared by either reading
the DATAX, DATAY, and DATAZ registers (Address 0x32 to
Address 0x37) until the interrupt condition is no longer valid
for the data-related interrupts or by reading the INT_SOURCE
register (Address 0x30) for the remaining interrupts. This section
describes the interrupts that can be set in the INT_ENABLE
register and monitored in the INT_SOURCE register.
DATA_READY Bit
The DATA_READY bit is set when new data is available and is
cleared when no new data is available.
SINGLE_TAP Bit
The SINGLE_TAP bit is set when a single acceleration event
that is greater than the value in the THRESH_TAP register
(Address 0x1D) occurs for less time than is specified in
the DUR register (Address 0x21).
DOUBLE_TAP Bit
The DOUBLE_TAP bit is set when two acceleration events
that are greater than the value in the THRESH_TAP register
(Address 0x1D) occur for less time than is specified in the DUR
register (Address 0x21). The second tap starts after the time
specified by the latent register (Address 0x22) but within the
time specified in the window register (Address 0x23). See the Tap
Detection section for more details.
Activity Bit
The activity bit is set when acceleration greater than the value stored
in the THRESH_ACT register (Address 0x24) is experienced on
any participating axis, as set by the ACT_INACT_CTL register
(Address 0x27).
Inactivity Bit
The inactivity bit is set when acceleration of less than the
value stored in the THRESH_INACT register (Address 0x25) is
experienced for more time than is specified in the TIME_INACT
register (Address 0x26) on all participating axes, as set by the
ACT_INACT_CTL register (Address 0x27). The maximum value
for TIME_INACT is 255 sec.
FREE_FALL Bit
The FREE_FALL bit is set when acceleration of less than the
value stored in the THRESH_FF register (Address 0x28) is
experienced for more time than is specified in the TIME_FF
register (Address 0x29) on all axes (logical AND). The FREE_FALL
interrupt differs from the inactivity interrupt as follows: all axes
always participate and are logically AND’ed, the timer period is
much smaller (1.28 sec maximum), and the mode of operation is
always dc-coupled.
Watermark Bit
The watermark bit is set when the number of samples in FIFO
equals the value stored in the samples bits (Register FIFO_CTL,
Address 0x38). The watermark bit is cleared automatically when
FIFO is read, and the content returns to a value below the value
stored in the samples bits.
Table 13. Interrupt Pin Digital Output
Limit1
Parameter
Test Conditions
Min
Max
Unit
Digital Output
Low Level Output Voltage (VOL)
IOL = 300 µA
0.2 × VDD I/O
V
High Level Output Voltage (VOH)
IOH = −150 µA
0.8 × VDD I/O
V
Low Level Output Current (IOL)
VOL = VOL, max
300
µA
High Level Output Current (IOH)
VOH = VOH, min
−150
µA
Pin Capacitance
fIN = 1 MHz, VIN = 2.6 V
8
pF
Rise/Fall Time
Rise Time (tR)2
CLOAD = 150 pF
210
ns
Fall Time (tF)3
CLOAD = 150 pF
150
ns
1
Limits are based on characterization results; not production tested.
2
Rise time is measured as the transition time from VOL, max to VOH, min of the interrupt pin.
3
Fall time is measured as the transition time from VOH, min to VOL, max of the interrupt pin.
Rev. C | Page 19 of 40



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