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ADXL346ACCZ-R2 データシート(PDF) 19 Page - Analog Devices |
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ADXL346ACCZ-R2 データシート(HTML) 19 Page - Analog Devices |
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19 / 40 page ![]() Data Sheet ADXL346 INTERRUPTS The ADXL346 provides two output pins for driving interrupts: INT1 and INT2. Both interrupt pins are push-pull, low impedance pins with the output specifications listed in Table 13. The default configuration of the interrupt pins is active high. This can be changed to active low by setting the INT_INVERT bit (Bit D5) in the DATA_FORMAT (Address 0x31) register. All functions can be used simultaneously, with the only limiting feature being that some functions may need to share interrupt pins. Interrupts are enabled by setting the appropriate bit in the INT_ENABLE register (Address 0x2E) and are mapped to either the INT1 or INT2 pin based on the contents of the INT_MAP register (Address 0x2F). When initially configuring the interrupt pins, it is recommended that the functions and interrupt mapping be done before enabling the interrupts. When changing the con- figuration of an interrupt, it is recommended that the interrupt be disabled first, by clearing the bit corresponding to that function in the INT_ENABLE register, and then the function be reconfigured before enabling the interrupt again. Configuration of the functions while the interrupts are disabled helps to prevent the accidental generation of an interrupt before it is desired. The interrupt functions are latched and cleared by either reading the DATAX, DATAY, and DATAZ registers (Address 0x32 to Address 0x37) until the interrupt condition is no longer valid for the data-related interrupts or by reading the INT_SOURCE register (Address 0x30) for the remaining interrupts. This section describes the interrupts that can be set in the INT_ENABLE register and monitored in the INT_SOURCE register. DATA_READY Bit The DATA_READY bit is set when new data is available and is cleared when no new data is available. SINGLE_TAP Bit The SINGLE_TAP bit is set when a single acceleration event that is greater than the value in the THRESH_TAP register (Address 0x1D) occurs for less time than is specified in the DUR register (Address 0x21). DOUBLE_TAP Bit The DOUBLE_TAP bit is set when two acceleration events that are greater than the value in the THRESH_TAP register (Address 0x1D) occur for less time than is specified in the DUR register (Address 0x21). The second tap starts after the time specified by the latent register (Address 0x22) but within the time specified in the window register (Address 0x23). See the Tap Detection section for more details. Activity Bit The activity bit is set when acceleration greater than the value stored in the THRESH_ACT register (Address 0x24) is experienced on any participating axis, as set by the ACT_INACT_CTL register (Address 0x27). Inactivity Bit The inactivity bit is set when acceleration of less than the value stored in the THRESH_INACT register (Address 0x25) is experienced for more time than is specified in the TIME_INACT register (Address 0x26) on all participating axes, as set by the ACT_INACT_CTL register (Address 0x27). The maximum value for TIME_INACT is 255 sec. FREE_FALL Bit The FREE_FALL bit is set when acceleration of less than the value stored in the THRESH_FF register (Address 0x28) is experienced for more time than is specified in the TIME_FF register (Address 0x29) on all axes (logical AND). The FREE_FALL interrupt differs from the inactivity interrupt as follows: all axes always participate and are logically AND’ed, the timer period is much smaller (1.28 sec maximum), and the mode of operation is always dc-coupled. Watermark Bit The watermark bit is set when the number of samples in FIFO equals the value stored in the samples bits (Register FIFO_CTL, Address 0x38). The watermark bit is cleared automatically when FIFO is read, and the content returns to a value below the value stored in the samples bits. Table 13. Interrupt Pin Digital Output Limit1 Parameter Test Conditions Min Max Unit Digital Output Low Level Output Voltage (VOL) IOL = 300 µA 0.2 × VDD I/O V High Level Output Voltage (VOH) IOH = −150 µA 0.8 × VDD I/O V Low Level Output Current (IOL) VOL = VOL, max 300 µA High Level Output Current (IOH) VOH = VOH, min −150 µA Pin Capacitance fIN = 1 MHz, VIN = 2.6 V 8 pF Rise/Fall Time Rise Time (tR)2 CLOAD = 150 pF 210 ns Fall Time (tF)3 CLOAD = 150 pF 150 ns 1 Limits are based on characterization results; not production tested. 2 Rise time is measured as the transition time from VOL, max to VOH, min of the interrupt pin. 3 Fall time is measured as the transition time from VOH, min to VOL, max of the interrupt pin. Rev. C | Page 19 of 40 |
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