KAI−08052

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14

Table 11. OPERATION CONDITIONS FOR DEFECT TESTING AT 275C

Description

Condition

Notes

Operational Mode

Two outputs, using VOUTa and VOUTc, continuous readout

HCCD Clock Frequency

20 MHz

Pixels Per Line

3520

1

Lines Per Frame

1360

2

Line Time

177.8 ms

Frame Time

241.8 ms

Photodiode Integration Time

(PD_Tint)

Mode A: PD_Tint = Frame Time = 241.8 ms, no electronic shutter used

Mode B: PD_Tint = 33 ms, electronic shutter used

VCCD Integration Time

224.0 ms

3

Temperature

27°C

Light Source

Continuous red, green and blue LED illumination

4

Operation

Nominal operating voltages and timing

1. Horizontal overclocking used.

2. Vertical overclocking used.

3. VCCD Integration Time = 1260 lines x Line Time, which is the total time a pixel will spend in the VCCD registers.

4. For monochrome sensor, only the green LED is used.

Table 12. DEFECT DEFINITIONS FOR TESTING AT 275C

Description

Definition

Standard Grade

Notes

Major dark field defective bright pixel

PD_Tint = Mode A → Defect ≥ 30 mV

or

PD_Tint = Mode B → Defect ≥ 4.6 mV

80

1

Major bright field defective dark pixel

Defect ≥ 12%

Cluster defect

A group of 2 to 10 contiguous major defective pixels, but no

more than 3 adjacent defects

horizontally.

15

2

Column defect

A group of more than 10 contiguous major

defective pixels along a single column

0

2

1. For the Bayer color device (KAI−08052−FBA), a bright field defective pixel deviates by 12% with respect to pixels of the same color.

2. Column and cluster defects are separated by no less than two (2) good pixels in any direction (excluding single pixel defects).

Defect Map

The defect map supplied with each sensor is based upon

testing at an ambient (27

°C) temperature. Minor point

defects are not included in the defect map. All defective

pixels are reference to pixel 1, 1 in the defect maps. See

Figure 14: Regions of interest for the location of pixel 1,1.