KAI-08052 datasheet(16/33 Pages) ONSEMI

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KAI−08052

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Global Non−Uniformity

This test is performed with the imager illuminated to a

level such that the output is at 70% of saturation

(approximately 560 mV). Prior to this test being performed

the substrate voltage has been set such that the charge

capacity of the sensor is 800 mV. Global non−uniformity is

defined as

GlobalNon−Uniformity + 100

ActiveAreaStandardDeviation

ActiveAreaSignal

Units: %rms.

Active Area Signal = Active Area Average − Dark Column

Average

Global Peak to Peak Non−Uniformity

This test is performed with the imager illuminated to a

level such that the output is at 70% of saturation

(approximately 560 mV). Prior to this test being performed

the substrate voltage has been set such that the charge

capacity of the sensor is 800 mV. The sensor is partitioned

into 768 sub regions of interest, each of which is 103 by 103

pixels in size. The average signal level of each of the 768 sub

regions of interest (ROI) is calculated. The signal level of

each of the sub regions of interest is calculated using the

following formula:

Signal of ROI[i] = (ROI Average in counts − Horizontal

overclock average in counts) * mV per count

Where i = 1 to 768. During this calculation on the 768 sub

regions of interest, the maximum and minimum signal levels

are found. The global peak to peak uniformity is then

calculated as:

GlobalUniformity + 100

MaximumSignal * MinimumSignal

ActiveAreaSignal

Units: %pp

Center Non−Uniformity

This test is performed with the imager illuminated to a

level such that the output is at 70% of saturation

(approximately 560 mV). Prior to this test being performed

the substrate voltage has been set such that the charge

capacity of the sensor is 800 mV. Defects are excluded for

the calculation of this test. This test is performed on the

center 100 by 100 pixels of the sensor. Center uniformity is

defined as:

Center ROI Uniformity + 100

Center ROI Standard Deviation

Center ROI Signal

Units: %rms.

Center ROI Signal = Center ROI Average − Dark Column

Average

Dark Field Defect Test

This test is performed under dark field conditions. The

sensor is partitioned into 768 sub regions of interest, each of

which is 103 by 103 pixels in size. In each region of interest,

the median value of all pixels is found. For each region of

interest, a pixel is marked defective if it is greater than or

equal to the median value of that region of interest plus the

defect threshold specified in the “Defect Definitions”

section.

Bright Field Defect Test

This test is performed with the imager illuminated to a

level such that the output is at approximately 476 mV. Prior

to this test being performed the substrate voltage has been set

such that the charge capacity of the sensor is 680 mV. The

average signal level of all active pixels is found. The bright

and dark thresholds are set as:

Dark defect threshold = Active Area Signal * threshold

Bright defect threshold = Active Area Signal * threshold

The sensor is then partitioned into 768 sub regions of

interest, each of which is 103 by 103 pixels in size. In each

region of interest, the average value of all pixels is found.

For each region of interest, a pixel is marked defective if it

is greater than or equal to the median value of that region of

interest plus the bright threshold specified or if it is less than

or equal to the median value of that region of interest minus

the dark threshold specified.

Example for major bright field defective pixels:

• Average value of all active pixels is found to be

560 mV

• Dark defect threshold: 560 mV * 12 % = 67 mV

• Bright defect threshold: 560 mV * 12 % = 67 mV

• Region of interest #1 selected. This region of interest is

pixels 13, 13 to pixels 115, 115.

♦ Median of this region of interest is found to be

560 mV.

♦ Any pixel in this region of interest that

≥ (560 + 67 mV) 627 mV in intensity will be

marked defective.

♦ Any pixel in this region of interest that

≤ (560 − 67 mV) 493 mV in intensity will be

marked defective.

• All remaining 768 sub regions of interest are analyzed

for defective pixels in the same manner.

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