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STW4510 データシート(PDF) 49 Page - STMicroelectronics |
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STW4510 データシート(HTML) 49 Page - STMicroelectronics |
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49 / 57 page  Obsolete Product(s) - Obsolete Product(s) STw4510 Test disclaimer 49/57 5 Test disclaimer 5.1 Guaranteed by design These parameters are measured during STMicroelectronics internal qualification (voltage range, temperature, etc....) which includes full characterization on standard and corner batches of the process. These parameters are partially measured or not measured at all during production testing. 5.2 Fully tested on package only These parameters are measured during STMicroelectronics internal qualification (voltage range, temperature, etc....) which includes full characterization on standard and corner batches of the process. These parameters are fully tested on package only and partial tests are performed on wafers. |
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