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TX58TEGXDDKTAX0 データシート(PDF) 27 Page - Toshiba Semiconductor |
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TX58TEGXDDKTAX0 データシート(HTML) 27 Page - Toshiba Semiconductor |
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27 / 121 page ![]() TOSHIBA CONFIDENTIAL Tx58TEGxDDKTAx0 TENTATIVE 2013-07-10C 26 TC58TEG6DDKTA00 / TC58TEG6DDKTAI0 TH58TEG7DDKTA20 / TH58TEG7DDKTAK0 TH58TEG8DDKTA20 / TH58TEG8DDKTAK0 2.14. High Speed Toggle DDR with ODT 2.14.1. ODT (On die termination) On Die Termination (ODT) is a feature that allows a NAND Flash device to turn on/off termination resistance for each DQ and DQS/ DQS . The ODT feature is designed to improve signal integrity of the memory channel by allowing the NAND Flash controller to independently turn on/off termination resistance for a selected target. NAND Flash memory supports self-termination only. 2.14.2. ODT setting ODT setting is configured by ‘SET FEATURE’ operation. Refer to 5.2.9 for the further information. Figure 6 defines an ODT setting sequence. Figure 6. ODT setting through ‘SET FEATURE’ 2.14.3. ODT behavior during Read operation ODT is enabled within Read pre-amble period after RE falling, and disabled on CE rising or one of CLE and ALE rising while CE is low. Figure 7 defines ODT enable/disable behavior and timings during data output. Figure 7. ODT enable/disable during Read |
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