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MPC5121E データシート(PDF) 77 Page - Freescale Semiconductor, Inc |
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MPC5121E データシート(HTML) 77 Page - Freescale Semiconductor, Inc |
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77 / 86 page ![]() System Design Information MPC5121E/MPC5123 Data Sheet, Rev. 1 Freescale Semiconductor 77 Figure 59. Recommended connection for pins of unused USB PHY 4.4 Pull-Up/Pull-Down Resistor Requirements The MPC5121e/MPC5123 requires external pull-up or pull-down resistors on certain pins. 4.4.1 Pull-Down Resistor Requirements for TEST pin The MPC5121e/MPC5123 requires a pull-down resistor on the test pin TEST. 4.4.2 Pull-Up Requirements for the PCI Control Lines PCI control signals always require pull-up resistors on the motherboard (not the expansion board) to ensure that they contain stable values when no agent is actively driving the bus. This includes PCI_FRAME, PCI_TRDY, PCI_IRDY, PCI_DEVSEL, PCI_STOP, PCI_SERR, PCI_PERR, and PCI_REQ. Refer to the PCI Local Bus specification. 4.5 JTAG The MPC5121e/MPC5123 provides you with an IEEE 1149.1 JTAG interface to facilitate board/system testing. It also provides a Common On-Chip Processor (COP) Interface, which shares the IEEE 1149.1 JTAG port. The COP Interface provides access to the MPC5121e/MPC5123's embedded e300 processor and to other on-chip resources. This interface provides a means for executing test routines and for performing software development and debug functions. 4.5.1 TRST Boundary scan testing is enabled through the JTAG interface signals. The TRST signal is optional in the IEEE 1149.1 specification but is provided on all processors that implement the PowerPC architecture. To obtain a reliable power-on reset performance, the TRST signal must be asserted during power-on reset. USB_XTALO USB_XTALI VSS NC USB_TPA NC USB_DN USB_DP Weak pull-up or pull-down USB_UID USB_VBUS VSS USB_PLL_PWR3 USB_PLL_GND VSS USB_VSSA_BIAS USB_RREF VSS VSS USB_VDDA_BIAS VSS VSS VDD_IO USB_VSSA VSS USB_VDDA VDD_IO MPC5121e/MPC5123 Preliminary |
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