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MCP6V06T データシート(PDF) 6 Page - Microchip Technology

部品番号 MCP6V06T
部品情報  300 關A, Auto-Zeroed Op Amps
PDF  44 Pages
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メーカー  MICROCHIP [Microchip Technology]
ホームページ  http://www.microchip.com
Logo MICROCHIP - Microchip Technology

MCP6V06T データシート(HTML) 6 Page - Microchip Technology

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MCP6V06/7/8
DS22093B-page 6
© 2008 Microchip Technology Inc.
1.3
Timing Diagrams
FIGURE 1-1:
Amplifier Start Up.
FIGURE 1-2:
Offset Correction Settling
Time.
FIGURE 1-3:
Output Overdrive Recovery.
FIGURE 1-4:
Chip Select (MCP6V08).
1.4
Test Circuits
The circuits used for the DC and AC tests are shown in
Figure 1-5 and Figure 1-6. Lay the bypass capacitors
out as discussed in Section 4.3.8 “Supply Bypassing
and Filtering”. RN is equal to the parallel combination
of RF and RG to minimize bias current effects.
FIGURE 1-5:
AC and DC Test Circuit for
Most Non-Inverting Gain Conditions.
FIGURE 1-6:
AC and DC Test Circuit for
Most Inverting Gain Conditions.
The circuit in Figure 1-7 tests the op amp input’s
dynamic behavior (i.e., IMD, tSTR, tSTL and tODR). The
potentiometer balances the resistor network (VOUT
should equal VREF at DC). The op amp’s common
mode input voltage is VCM =VIN/2. The error at the
input (VERR) appears at VOUT with a noise gain of
10 V/V.
FIGURE 1-7:
Test Circuit for Dynamic
Input Behavior.
VDD
VOS
VOS +50µV
VOS –50µV
tSTR
0V
1.8V to 5.5V
1.8V
VIN
VOS
VOS +50µV
VOS +50µV
tSTL
VIN
VOUT
VDD
VSS
tODR
tODR
VDD/2
VIL
High-Z
tON
VIH
CS
tOFF
VOUT
-2 µA
High-Z
ISS
-2 µA
300 µA
1µA
IDD
1µA
300 µA
VDD/5 MΩ
ICS
VDD/5 MΩ
5pA
(typical)
(typical)
(typical)
(typical)
(typical)
(typical)
(typical)
(typical)
(typical)
VDD
MCP6V0X
RG
RF
RN
VOUT
VIN
VDD/3
1µF
CL
RL
VL
100 nF
RISO
VDD
MCP6V0X
RG
RF
RN
VOUT
VDD/3
VIN
1µF
CL
RL
VL
100 nF
RISO
VDD
MCP6V0X
VOUT
1µF
CL
RL
VL
100 nF
RISO
20.0 k
Ω
24.9
Ω
20.0 k
Ω
50
Ω
VIN
VREF
0.1%
0.1%
25 turn
20.0 k
Ω
20.0 k
Ω
0.1%
0.1%



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