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L99DZ320 データシート(PDF) 16 Page - STMicroelectronics

部品番号 L99DZ320
部品情報  Automotive rear door device with CAN FD and LIN
PDF  146 Pages
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メーカー  STMICROELECTRONICS [STMicroelectronics]
ホームページ  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

L99DZ320 データシート(HTML) 16 Page - STMicroelectronics

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2.4.6
Reset output
The voltages are referred to GND and currents are assumed positive, when the current flows into the pin.
4 V ≤ VS ≤ 28 V, 4 V < VSREG < 28 V, TJ = -40 to 150°C, unless otherwise specified.
Table 12. Reset output
Symbol
Parameter
Test condition
Min.
Typ.
Max.
Unit
Item
VRT1
Reset threshold voltage1
VV1 decreasing
3.3
3.5
3.7
V
C.045
VRT2
Reset threshold voltage2
VV1 decreasing
3.6
3.8
4
V
C.046
VRT3
Reset threshold voltage3
VV1 decreasing
3.8
4.0
4.2
V
C.047
VRT4-1
Reset threshold voltage4
VV1 decreasing
4.1
4.3
4.5
V
C.048
VRT4-2
Reset threshold voltage4
VV1 increasing
4.6
4.75
4.9
V
C.049
VRESET
Reset pin low output voltage
V1 > 1V, IRESET = 5 mA
0.3
0.5
V
C.050
RRESET
Reset pull-up int. resistor
70
110
180
kΩ
C.051
tRR
Reset reaction time
Tested by scan
6
40
μs
C.052
tUV1
V1 undervoltage filter time
Tested by scan
16
μs
C.053
tRD
Reset pulse duration
Tested by scan
1.5
2.0
2.5
ms
C.054
2.4.7
Watchdog
(see also Section 3.6: Configurable window watchdog)
4.5 V < VS < 28 V, 4.5 V < VSREG < 28 V, TJ = -40 °C to 150 °C, unless otherwise specified.
Table 13. Watchdog
Symbol
Parameter
Test condition
Min.
Typ.
Max.
Unit
Item
tLW
Long open window
Tested by scan
246
300
375
ms
A.027
TEFW1
Early Failure window 1
Tested by scan
4.5
ms
A.028
TLFW1
Late Failure window 1
Tested by scan
20
ms
A.029
TSW1
Safe window 1
Tested by scan
7.5
12
ms
A.030
TEFW2
Early Failure window 2
Tested by scan
22.3
ms
A.031
TLFW2
Late Failure window 2
Tested by scan
100
ms
A.032
TSW2
Safe window 2
Tested by scan
37.5
60
ms
A.033
L99DZ320
Electrical specifications
DS14235 - Rev 5
page 16/146



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