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SPC58EE80C3 データシート(PDF) 74 Page - STMicroelectronics |
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SPC58EE80C3 データシート(HTML) 74 Page - STMicroelectronics |
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74 / 154 page ![]() Electrical characteristics SPC58EEx, SPC58NEx 74/154 DS11646 Rev 4 DCREF CC D PLL reference clock duty cycle (CLKIN) — 30 — 70 % PN CC D Integrated phase noise (single side band) fRF_REF = 20 MHz — — -58 dBc fVCO CC P PLL VCO frequency — 312 — 320(3) MHz tLOCK CC D PLL phase lock — — — 150(4) µs ΔPERREF SR T Input reference clock jitter (peak to peak) Single period, fRF_REF =20 MHz —— 350 ps T Long term, fRF_REF =20 MHz -500 — 500 ps ΔPEREYE CC T Output Eye Jitter (peak to peak)(5) —— — 400 ps 1. The specifications in this table apply to both the interprocessor bus and debug LFAST interfaces. 2. If the input frequency is lower than 20 MHz, it is required to set a input division factor of 1. 3. The 320 MHz frequency is achieved with a 20 MHz reference clock. 4. The total lock time is the sum of the coarse lock time plus the programmable lock delay time 2 clock cycles of the peripheral bridge clock that is connected to the PLL on the device (to set the PLL enable bit). 5. Measured at the transmitter output across a 100 Ω termination resistor on a device evaluation board. See Figure 12. Table 36. LFAST PLL electrical characteristics(1) (continued) Symbol C Parameter Conditions Value Unit Min Typ Max |
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