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SPC58EE80C3 データシート(PDF) 90 Page - STMicroelectronics

部品番号 SPC58EE80C3
部品情報  32-bit Power Architecture microcontroller for automotive ASIL-D applications
PDF  154 Pages
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メーカー  STMICROELECTRONICS [STMicroelectronics]
ホームページ  http://www.st.com
Logo STMICROELECTRONICS - STMicroelectronics

SPC58EE80C3 データシート(HTML) 90 Page - STMicroelectronics

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Electrical characteristics
SPC58EEx, SPC58NEx
90/154
DS11644 Rev 4
terfm
Erase rate Factory Mode(8)
4.0
C
5.2
5.8
C
C s/MB
tffprogram
Full flash programming
time(9)
12.0
C
17.8
22.0
P
15.4
C
s
tfferase
Full flash erasing time(9)
25.0
C
40.0
50.0
P
40.0
C
s
tESRT
Erase suspend request
rate(10)
200
T
— µs
tPSRT
Program suspend request
rate(10)
30
T
— µs
tAMRT
Array Integrity Check -
Margin Read suspend
request rate
15
T
— µs
tPSUS
Program suspend latency(11)
——
12
T
µs
tESUS
Erase suspend latency(11)
——
22
T
µs
tAIC0S
Array Integrity Check (6.0
MB, sequential)(12)
40
T
— ms
tAIC256KS
Array Integrity Check (256
KB, sequential)(12)
1.5
T
— ms
tAIC0P
Array Integrity Check (6.0
MB, proprietary)(12)
4.0
T
s
tMR0S
Margin Read (6.0 MB,
sequential)(12)
120
T
— ms
tMR256KS
Margin Read (256 KB,
sequential)(12)
4.0
T
— ms
1. Characteristics are valid both for Data Flash and Code Flash, unless specified in the characteristics column.
2. Actual hardware operation times; this does not include software overhead.
3. Typical program and erase times assume nominal supply values and operation at 25 °C.
4. Typical End of Life program and erase times represent the median performance and assume nominal supply values.
Typical End of Life program and erase values may be used for throughput calculations. These values are characteristic, but
not tested.
5. Lifetime maximum program & erase times apply across the voltages and temperatures and occur after the specified
number of program/erase cycles. These maximum values are characterized but not tested or guaranteed.
6. Initial factory condition: < 100 program/erase cycles, 25 °C typical junction temperature and nominal (± 5%) supply
voltages.
7. Initial maximum “All temp” program and erase times provide guidance for time-out limits used in the factory and apply for
less than or equal to 100 program or erase cycles, –40 °C < TJ < 150 °C junction temperature and nominal (± 5%) supply
voltages.
8. Rate computed based on 256 KB sectors.
9. Only code sectors, not including EEPROM.
10. Time between suspend resume and next suspend. Value stated actually represents Min value specification.
Table 47. Flash memory program and erase specifications
Symbol
Characteristics(1)(2)
Value
Unit
Typ(3) C
Initial max
Typical
end of
life(4)
Lifetime
max(5)
C
25 °C
(6)
All
temp
(7)
C
< 1 K
cycles
< 250 K
cycles



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