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SPC58EE80C3 データシート(PDF) 38 Page - STMicroelectronics |
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SPC58EE80C3 データシート(HTML) 38 Page - STMicroelectronics |
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38 / 154 page ![]() Electrical characteristics SPC58EEx, SPC58NEx 38/154 DS11646 Rev 4 IDYN_S CC D Dynamic I/O current for STRONG configuration CL =25pF, VDD =5.0 V ± 10% —— 57 mA CL =50pF, VDD =5.0 V ± 10% — — 63.5 CL =25pF, VDD =3.3 V ± 10% —— 31 CL =50pF, VDD =3.3 V ± 10% — — 33.5 IDYN_V CC D Dynamic I/O current for VERY STRONG configuration CL =25pF, VDD =5.0 V ± 10% —— 62 mA CL =50pF, VDD =5.0 V ± 10% —— 70 CL =25pF, VDD =3.3 V ± 10% —— 52 CL =50pF, VDD =3.3 V ± 10% —— 55 1. I/O current consumption specifications for the 4.5 V ≤ VDD_HV_IO ≤ 5.5 V range are valid for VSIO_[VSIO_xx] = 1, and VSIO[VSIO_xx] = 0 for 3.0 V ≤ VDD_HV_IO ≤ 3.6 V. 2. Average consumption in one pad toggling cycle. 3. Stated maximum values represent peak consumption that lasts only a few ns during I/O transition. When possible (timed output) it is recommended to delay transition between pads by few cycles to reduce noise and consumption. Table 17. I/O consumption (continued) Symbol C Parameter Conditions Value(1) Unit Min Typ Max |
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