SPC58EE80C3 datasheet(22/154 Pages) STMICROELECTRONICS

部品番号	SPC58EE80C3

部品情報	32-bit Power Architecture microcontroller for automotive ASIL-D applications

PDF	154 Pages

Scroll/Zoom	100%

メーカー	STMICROELECTRONICS [STMicroelectronics]

ホームページ	http://www.st.com

Logo

22 / 154 page

Electrical characteristics

SPC58EEx, SPC58NEx

22/154

DS11646 Rev 4

3.4

Electrostatic discharge (ESD)

The following table describes the ESD ratings of the device:

•

All ESD testing are in conformity with CDF-AEC-Q100 Stress Test Qualification for

Automotive Grade Integrated Circuits,

•

Device failure is defined as: “If after exposure to ESD pulses, the device does not meet

the device specification requirements, which include the complete DC parametric and

functional testing at room temperature and hot temperature, maximum DC parametric

variation within 10% of maximum specification”.

Table 8. ESD ratings

Parameter

Conditions

Value

Unit

ESD for Human Body Model (HBM)(1)

All pins

2000

ESD for field induced Charged Device Model (CDM)(2)

All pins

500

Corner Pins

750

1. This parameter tested in conformity with ANSI/ESD STM5.1-2007 Electrostatic Discharge Sensitivity Testing.

2. This parameter tested in conformity with ANSI/ESD STM5.3-1990 Charged Device Model - Component Level.

SPC58EE80C3 データシート(PDF) 22 Page - STMicroelectronics